Anasys Instruments

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01Q SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]711
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 6200
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS495
 
  
 
G01K MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 244
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 177

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9778282 Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopyApr 14, 17Oct 03, 17[G01N, G01Q]
9658247 Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopyMar 01, 15May 23, 17[G01N, G01Q]
9372154 Method and apparatus for infrared scattering scanning near-field optical microscopyJul 02, 14Jun 21, 16[G01N, G01Q]
8914911 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopyMar 14, 13Dec 16, 14[B82Y, G01N, G01Q, G01B]
8869602 High frequency deflection measurement of IR absorptionNov 30, 11Oct 28, 14[G01Q, G01B]
8793811 Method and apparatus for infrared scattering scanning near-field optical microscopyMar 15, 13Jul 29, 14[G01Q]
8533861 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopyNov 23, 11Sep 10, 13[G01N, G01Q, G01B]
8387443 Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometerSep 11, 09Mar 05, 13[G01B]
8177422 Transition temperature microscopyAug 15, 08May 15, 12[G01K, G01N]
7977636 Infrared imaging using thermal radiation from a scanning probe tipAug 12, 08Jul 12, 11[G01J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2006/0222,047 Method and apparatus for localized infrared spectrocopy and micro-tomography using a combination of thermal expansion and temperature change measurementsAbandonedApr 05, 06Oct 05, 06[G01K]

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